发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor memory device that can be microfabricated while ensuring a refresh time margin sufficiently. <P>SOLUTION: A memory cell is configured by a readout transistor, a write-in transistor, and a capacitor. In such a configuration, the capacitor controls a potential to be applied to a gate of the readout transistor. The write-in transistor controls the writing and eliminating of data, and is configured by a transistor with a small off-time current so that electric charge stored in the capacitor is not lost by a leakage current of the write-in transistor. A semiconductor layer constituting the write-in transistor is provided so as to bridge between a gate electrode and a source region of the readout transistor. The capacitor is provided so as to be overlapped with the gate electrode of the readout transistor. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012124472(A) 申请公布日期 2012.06.28
申请号 JP20110245276 申请日期 2011.11.09
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 ARAI YASUYUKI
分类号 H01L21/8242;G11C11/405;H01L21/336;H01L21/8247;H01L27/108;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8242
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