发明名称 |
TESTING SYSTEM AND PACKAGE RETAINER |
摘要 |
<p>With a simple configuration, the time required for testing individually-disconnected test objects can be shortened by providing the following: a tray (10) having a plurality of retaining holes (11) that hold semiconductor packages (20) to be tested; a contact probe that is connected to the electrodes of the semiconductor packages (20); a probe-holder that holds the contact probe; and a position-determining means that is provided on the probe-holder and determines the position of the semiconductor packages (20) with respect to the retaining holes (11) when testing is carried out.</p> |
申请公布号 |
WO2012086653(A1) |
申请公布日期 |
2012.06.28 |
申请号 |
WO2011JP79551 |
申请日期 |
2011.12.20 |
申请人 |
NHK SPRING CO., LTD.;HIRONAKA, KOHEI |
发明人 |
HIRONAKA, KOHEI |
分类号 |
G01R31/26;G01R1/067 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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