发明名称 A PROMPT GAMMA-RAY DETECTION APPARATUS FOR ANALYZING CHEMICAL MATERIALS BY USING FEMTO SECOND PULSE LASER INDUCED NEUTRONS
摘要 PURPOSE: A prompt gamma measure system for analyzing a chemical sample using femto second pulse laser induced neutrons is provided to non-destructively analyze constituents inside a sample by measuring prompt gamma rays caused by a nuclear reaction of a nucleus of a chemical substance and thermal neutron. CONSTITUTION: A prompt gamma measure system(10) for analyzing a chemical sample using femto second pulse laser induced neutrons comprises an ultra high frequency laser unit, a vacuum chamber(12), a target mount, a rotator(14), an outer cover, a sample mounting part(16), a lithium polyethylene port(17), a gamma ray measurement part, and an extension port(21). The ultrahigh frequency laser unit has properties of beam energy generating a D-D fusion reaction. The vacuum chamber creates neutrons by the ultrahigh purse laser frequency inducement D-D fusion reaction in the ultrahigh frequency laser unit. The target mount can mount a plastic target having heavy hydrogen as a cylinder form. The rotator rotates the plastic target so that a continuous oscillation of the femto second pulse laser induced neutrons is possible. The outer cover minimizes the emission of the neutrons from a whole outside part of the target mount except for a laser penetration part. A sample which is a measuring object is mounted on the sample mounting part.
申请公布号 KR20120069228(A) 申请公布日期 2012.06.28
申请号 KR20100130687 申请日期 2010.12.20
申请人 KOREA ATOMIC ENERGY RESEARCH INSTITUTE 发明人 YEA, KWON HAE;CHA, HYUNG KI;LEE, SUNG MAN;PARK, SANG SOON;PARK, SEONG HEE
分类号 G01N23/222;G01T1/16;G01V5/00 主分类号 G01N23/222
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