发明名称 |
A PROMPT GAMMA-RAY DETECTION APPARATUS FOR ANALYZING CHEMICAL MATERIALS BY USING FEMTO SECOND PULSE LASER INDUCED NEUTRONS |
摘要 |
PURPOSE: A prompt gamma measure system for analyzing a chemical sample using femto second pulse laser induced neutrons is provided to non-destructively analyze constituents inside a sample by measuring prompt gamma rays caused by a nuclear reaction of a nucleus of a chemical substance and thermal neutron. CONSTITUTION: A prompt gamma measure system(10) for analyzing a chemical sample using femto second pulse laser induced neutrons comprises an ultra high frequency laser unit, a vacuum chamber(12), a target mount, a rotator(14), an outer cover, a sample mounting part(16), a lithium polyethylene port(17), a gamma ray measurement part, and an extension port(21). The ultrahigh frequency laser unit has properties of beam energy generating a D-D fusion reaction. The vacuum chamber creates neutrons by the ultrahigh purse laser frequency inducement D-D fusion reaction in the ultrahigh frequency laser unit. The target mount can mount a plastic target having heavy hydrogen as a cylinder form. The rotator rotates the plastic target so that a continuous oscillation of the femto second pulse laser induced neutrons is possible. The outer cover minimizes the emission of the neutrons from a whole outside part of the target mount except for a laser penetration part. A sample which is a measuring object is mounted on the sample mounting part.
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申请公布号 |
KR20120069228(A) |
申请公布日期 |
2012.06.28 |
申请号 |
KR20100130687 |
申请日期 |
2010.12.20 |
申请人 |
KOREA ATOMIC ENERGY RESEARCH INSTITUTE |
发明人 |
YEA, KWON HAE;CHA, HYUNG KI;LEE, SUNG MAN;PARK, SANG SOON;PARK, SEONG HEE |
分类号 |
G01N23/222;G01T1/16;G01V5/00 |
主分类号 |
G01N23/222 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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