发明名称 |
PROBE MANUFACTURING METHOD, PROBE STRUCTURE, PROBE APPARATUS, AND TEST APPARATUS |
摘要 |
Minute probes are created to correspond to the alignment of the input/output terminals of a device under test. A probe manufacturing method of manufacturing a probe, includes: forming a contact section on a probe main body; and shaping at least one of the contact section and the probe main body by cutting by means of a cutting tool. The contact section is formed on a substrate that is to become the probe main body, and the probe manufacturing method further includes: after shaping at least one of the contact section and the substrate that is to become the probe main body, removing the portion of the substrate excluding the probe main body thereby forming a probe. |
申请公布号 |
US2012161806(A1) |
申请公布日期 |
2012.06.28 |
申请号 |
US201113172856 |
申请日期 |
2011.06.30 |
申请人 |
ADVANTEST CORPORATION |
发明人 |
KITAZUME HIDENORI;ASANO KOJI |
分类号 |
G01R31/20;G01R1/067;H01R43/16 |
主分类号 |
G01R31/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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