| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of detecting a surface defect capable of easily detecting a surface defect of an object. <P>SOLUTION: When detecting the surface defect of an object 10 using a surface detect detector 1, an imaging part 2 obtains the image of the surface 10a of the object 10 at first. Next, an image analysis part 3 prepares a histogram of brightness of the image to set the median value between a first gradation and a second gradation in the histogram as a binarization level. Then, an image 11 is subjected to binarization processing at the binarization level set by the image analysis part 3. Thus, the image of the surface 10a of the object 10 can be obtained whose surface defect can be discriminated by visual inspection. <P>COPYRIGHT: (C)2012,JPO&INPIT |
