发明名称 SURFACE POSITION DETECTION APPARATUS, EXPOSURE APPARATUS, AND EXPOSURE METHOD
摘要 A surface position detection apparatus capable of highly precisely detecting the surface position of a surface to be detected without substantially being affected by relative positional displacement due to a polarization component occurring in a light flux having passed through a reflective surface. In the apparatus, a projection system has a projection side prism member (7) having first reflective surfaces (7b, 7c), and a light receiving system has a light receiving prism member (8) having second reflective surfaces (8b, 8c) arranged in correspondence with the projection side prism member. The surface position detection apparatus further has a member for compensating relative positional displacement due to a polarization component of a light flux having passed through the first and second reflective surfaces
申请公布号 US2012162623(A1) 申请公布日期 2012.06.28
申请号 US201213405524 申请日期 2012.02.27
申请人 HIDAKA YASUHIRO;NAGAYAMA TADASHI;NIKON CORPORATION 发明人 HIDAKA YASUHIRO;NAGAYAMA TADASHI
分类号 G03B27/34;G01B11/14;G01J4/00;G03B27/58;H05K3/00 主分类号 G03B27/34
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