发明名称 CAPACITANCE MEASUREMENT CIRCUIT AND METHOD FOR MEASURING CAPACITANCE
摘要 Disclosed are a capacitance measurement circuit and a method for measuring capacitance. The capacitance measurement circuit and the method for measuring the capacitance measure capacitance values by changing control codes when a control unit generates control codes of a predetermined number according to a defined rule and determines sensed signal levels as normal levels according to the generated control codes. Accordingly, the measured capacitance values can be outputted as stable values irrespective of noise interference.
申请公布号 WO2012060591(A3) 申请公布日期 2012.06.28
申请号 WO2011KR08190 申请日期 2011.10.31
申请人 ATLAB INC.;LEE, BANG-WON;MOON, BYUNG-JOON;HONG, JAE-SURK 发明人 LEE, BANG-WON;MOON, BYUNG-JOON;HONG, JAE-SURK
分类号 G01R27/26 主分类号 G01R27/26
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