TEST HANDLER AND METHOD FOR TESTING SEMICONDUCTOR DEVICE

摘要

PURPOSE: A test handler and a semiconductor device test method are provided to reduce the time for regulating the temperatures of semiconductor devices during a test of the semiconductor devices. CONSTITUTION: A test handler(1) comprises a chamber unit for testing semiconductor devices received in a test tray(T). The chamber unit comprises a test chamber(21) having a high fix board(H). A first contact unit(3) connects the semiconductor devices received in the test tray to the high fix board. A first temperature control unit(4) selectively provides first heating liquid and first cooling liquid to the semiconductor devices in contact with the first contact unit.