发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PURPOSE: A semiconductor device and a manufacturing method thereof are provided to reduce crack generation when a nitride semiconductor layer is grown by compensating for tensile stress with compressive stress. CONSTITUTION: A secondary seed layer(15) includes a first substance for masking and a second material for secondary seeding. A nucleation layer(20) is grown up on the secondary seed layer. A nitride semiconductor layer(25) is grown up on the nucleation layer. A buffer layer is formed between the nucleation layer and the nitride semiconductor layer.
申请公布号 KR20120068394(A) 申请公布日期 2012.06.27
申请号 KR20100130001 申请日期 2010.12.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JUN YOUN;CHAE, SU HEE;HONG, HYUN GI;TAK, YOUNG JO
分类号 H01L21/20 主分类号 H01L21/20
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