SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要
PURPOSE: A semiconductor device and a manufacturing method thereof are provided to reduce crack generation when a nitride semiconductor layer is grown by compensating for tensile stress with compressive stress. CONSTITUTION: A secondary seed layer(15) includes a first substance for masking and a second material for secondary seeding. A nucleation layer(20) is grown up on the secondary seed layer. A nitride semiconductor layer(25) is grown up on the nucleation layer. A buffer layer is formed between the nucleation layer and the nitride semiconductor layer.
申请公布号
KR20120068394(A)
申请公布日期
2012.06.27
申请号
KR20100130001
申请日期
2010.12.17
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
KIM, JUN YOUN;CHAE, SU HEE;HONG, HYUN GI;TAK, YOUNG JO