发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor device and a manufacturing method thereof are provided to improve an electric property by using a transistor whose threshold voltage is controlled. CONSTITUTION: A gate electrode(104) is basically made of tungsten oxide. A gate insulation layer(112) is contacted with the gate electrode. A semiconductor layer(106) partially overlaps the gate electrode by interposing the gate insulation layer. A pair of electrodes are located between the semiconductor layer and the gate insulation layer.
申请公布号 KR20120068738(A) 申请公布日期 2012.06.27
申请号 KR20110136521 申请日期 2011.12.16
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 ENDO YUTA;SASAKI TOSHINARI;NODA KOSEI;SATO HITOMI;SATO YUHEI
分类号 H01L29/786;H01L21/336 主分类号 H01L29/786
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