发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor device and a manufacturing method thereof are provided to improve an electric property by using a transistor whose threshold voltage is controlled. CONSTITUTION: A gate electrode(104) is basically made of tungsten oxide. A gate insulation layer(112) is contacted with the gate electrode. A semiconductor layer(106) partially overlaps the gate electrode by interposing the gate insulation layer. A pair of electrodes are located between the semiconductor layer and the gate insulation layer. |
申请公布号 |
KR20120068738(A) |
申请公布日期 |
2012.06.27 |
申请号 |
KR20110136521 |
申请日期 |
2011.12.16 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
ENDO YUTA;SASAKI TOSHINARI;NODA KOSEI;SATO HITOMI;SATO YUHEI |
分类号 |
H01L29/786;H01L21/336 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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