发明名称 Method of manufacturing substrate
摘要 The present disclosure relates to a method of manufacturing a substrate. The method includes: (a) forming through holes by applying an anisotropic etching to a silicon substrate from a first surface of the silicon substrate; (b) forming a first insulating film to cover the first surface of the silicon substrate, surfaces of the silicon substrate exposed from the through holes, and a second surface of the silicon substrate opposite to the first surface; (c) forming an opening in a portion of the first insulating film provided on the second surface, the portion of the first insulating film corresponding to an area in which the through holes are formed; (d) etching the silicon substrate using the first insulating film provided on the second surface as a mask, thereby forming a cavity in the silicon substrate; and (e) removing the first insulating film.
申请公布号 EP2040521(B1) 申请公布日期 2012.06.27
申请号 EP20080164731 申请日期 2008.09.19
申请人 SHINKO ELECTRIC INDUSTRIES CO., LTD. 发明人 TAGUCHI, YUICHI;SHIRAISHI, AKINORI;SUNOHARA, MASAHIRO;MURAYAMA, KEI;SAKAGUCHI, HIDEAKI;HIGASHI, MITSUTOSHI
分类号 H01L23/48;H01L33/44;H01L33/60;H01L33/62 主分类号 H01L23/48
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