发明名称 METHOD FOR FABRICATING THE SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to stably form a plug by suppressing a loss of an interlayer dielectric layer. CONSTITUTION: A peripheral circuit transistor with a gate is formed. A planarized interlayer dielectric layer(40) is formed in a structure with a cell transistor and a peripheral circuit transistor. A capping insulation layer(41) with a relatively low etching rate is formed on the interlayer dielectric layer. A contact hole is formed by selectively etching the interlayer dielectric layer and the capping insulation layer to expose a junction area of the cell transistor.
申请公布号 KR20120068618(A) 申请公布日期 2012.06.27
申请号 KR20100130314 申请日期 2010.12.17
申请人 SK HYNIX INC. 发明人 YOON, SUNG HYUN
分类号 H01L21/28;H01L21/336 主分类号 H01L21/28
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