SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING SYSTEM FOR PERFORMING THE SAME
摘要
PURPOSE: A substrate processing method and a substrate processing system for executing the same are provided to easily confirm the progress and end-point of a super-critical fluid process by analyzing concentration of target material within a discharged fluid in real time. CONSTITUTION: A substrate is loaded within a processing chamber(S110). A super-critical fluid process is executed by providing a supercritical fluid to the substrate. The super-critical fluid is discharged from the processing chamber during the super-critical fluid process(S120). A real-time concentration value of a target material included within the discharged super-critical fluid is measured(S140). An end-point of the super-critical fluid process is determined according to the real-time concentration value of the target material(S140).
申请公布号
KR20120067403(A)
申请公布日期
2012.06.26
申请号
KR20100128776
申请日期
2010.12.16
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
CHO, YONG JHIN;LEE, KUN TACK;LEE, HYO SAN;KIM, YOUNG HOO;LEE, JUNG WON;BAE, SANG WON;OH, JUNG MIN