发明名称 FUSE IN SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATION THE SAME
摘要 PURPOSE: Fuse of a semiconductor device and a manufacturing method thereof are provided to effectively prevent uncut failure to be generated in the repair process by forming a capping layer through the surface processing. CONSTITUTION: A first fuse patterns(12) are formed on substrate(11). The first fuse patterns have a structure capped by an insulating layer(14) and a first anti oxidation layer(13A). The insulating layer comprises an open region(15) exposing the end of the first fuse patterns. A second fuse pattern(16A) interlinks an interval between the first fuse patterns. A protective film(17) comprises a fuse box exposing the second fuse pattern. A capping layer is formed on the surface of the second fuse pattern. A second anti oxidation layer is formed at the sidewall of the second fuse pattern.
申请公布号 KR20120067522(A) 申请公布日期 2012.06.26
申请号 KR20100128960 申请日期 2010.12.16
申请人 SK HYNIX INC. 发明人 KIM, JEONG SOO
分类号 H01L23/62;H01L21/82 主分类号 H01L23/62
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