TEST SYSTEM FOR SEMICONDUCTOR DEVICE AND APPARATUS FOR ADDING CURRENT INCLUDED THE SYSTEM

摘要

PURPOSE: A semiconductor device test system and a current summing apparatus included in the same are provided to offer enough current by adding supply currents and supplying it to a test target semiconductor device. CONSTITUTION: A semiconductor test device(100) sources and sinks a current with a pin of a test target semiconductor device. A current summing apparatus adds supply currents of partial power unit among a plurality of power units and supplies added supply currents to the test target semiconductor device. Forward direction current route units(310) are respectively connected to different power unit and are equally connected with the pin. Backward current route units(320) are parrallely connected with the forward direction current route units.