发明名称 Probe microscope setup method
摘要 A scanning probe microscope and method of operation for monitoring and assessing proper tracking between the tip and sample, as well as automating at least some aspects of AFM setup previously done manually. Preferably, local slopes corresponding to the acquired data are compared to determine a tracking metric that is self-normalizing.
申请公布号 US8205487(B2) 申请公布日期 2012.06.26
申请号 US20090419898 申请日期 2009.04.07
申请人 RICE ALAN F.;HUANG LIN;BRUKER NANO, INC. 发明人 RICE ALAN F.;HUANG LIN
分类号 G01Q10/00;G01Q60/24;G01Q10/06;G01Q30/04 主分类号 G01Q10/00
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