| 摘要 |
PURPOSE: A nonvolatile memory device and a testing method thereof are provided to reduce test time by removing time required for a data transmitting path from an input and output pad to a page buffer. CONSTITUTION: Test pattern data is programmed in a specific block of a memory area(S201). The test pattern data for testing a nonvolatile memory device is loaded on a page buffer from the memory area(S203). The loaded test pattern data is programmed in a test memory area(S205). A read operation is performed in the test memory area programmed with the test pattern data(S207). |
