发明名称 METHOD FOR CONTROLLING DEFECT AND APPARATUS USING THE SAME
摘要 PURPOSE: A defect type controlling method and an apparatus for performing the same are provided to set up a sector including hard defect if a defect type is matched with a hard defect. CONSTITUTION: A plurality of indexes is arranged(S10). The values of moving summation are calculated by selected indexes(S20). A plurality of moving summation is compared with a reference value(S30). The defect type is determined as a hard defect(S50). A sector including the hard defect is set as unsable(S70).
申请公布号 KR20120067055(A) 申请公布日期 2012.06.25
申请号 KR20100128463 申请日期 2010.12.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO, JOO WON;JEONG, SEUNG YOUL
分类号 G11B20/18 主分类号 G11B20/18
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