发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to prevent the short between an active area and a storage node contact plug by forming an etching prevention film on a bottom surface of the storage node contact hole. CONSTITUTION: An inter-layer insulating film(35) is formed on a substrate(31). The inter-layer insulating film is selectively etched and a storage node contact hole is formed. An etching prevention film(37) is formed on a bottom surface of the storage node contact hole. A conductive film(39) for the storage node contact plug is formed to fill the storage node contact hole. The conductive film for the storage node contact plug is etched and a damascene pattern(40) is formed.
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申请公布号 |
KR20120066850(A) |
申请公布日期 |
2012.06.25 |
申请号 |
KR20100128146 |
申请日期 |
2010.12.15 |
申请人 |
SK HYNIX INC. |
发明人 |
PARK, JUM YONG;SHIN, JONG HAN;KIM, JUNG NAM |
分类号 |
H01L21/8242;H01L27/108 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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