发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to prevent the short between an active area and a storage node contact plug by forming an etching prevention film on a bottom surface of the storage node contact hole. CONSTITUTION: An inter-layer insulating film(35) is formed on a substrate(31). The inter-layer insulating film is selectively etched and a storage node contact hole is formed. An etching prevention film(37) is formed on a bottom surface of the storage node contact hole. A conductive film(39) for the storage node contact plug is formed to fill the storage node contact hole. The conductive film for the storage node contact plug is etched and a damascene pattern(40) is formed.
申请公布号 KR20120066850(A) 申请公布日期 2012.06.25
申请号 KR20100128146 申请日期 2010.12.15
申请人 SK HYNIX INC. 发明人 PARK, JUM YONG;SHIN, JONG HAN;KIM, JUNG NAM
分类号 H01L21/8242;H01L27/108 主分类号 H01L21/8242
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