发明名称 METHOD FOR CLEANING A SEMICONDUCTOR WAFER COMPOSED OF SILICON DIRECTLY AFTER A PROCESS OF POLISHING OF THE SEMICONDUCTOR WAFER
摘要 PURPOSE: A method for washing a semiconductor wafer consisting of silicon just after a polishing process of the semiconductor wafer is provided to effectively and rapidly wash the polished front side and rear side of the semiconductor wafer. CONSTITUTION: A semiconductor wafer is transferred from a polishing plate to a first cleaning module. The semiconductor wafer is washed between rollers rotated by water. An aqueous solution containing a hydrogen fluoride and a surfactant is sprayed to the side of the semiconductor wafer. The water is sprayed to the side of the semiconductor wafer. The semiconductor wafer is dipped into a water-soluble alkaline cleaning solution. The semiconductor wafer is washed between the rollers rotated by the water. The water is sprayed to the semiconductor wafer. The semiconductor wafer is dried.
申请公布号 KR20120067284(A) 申请公布日期 2012.06.25
申请号 KR20110127948 申请日期 2011.12.01
申请人 SILTRONIC AG 发明人 LANZ REINHOLD
分类号 H01L21/302 主分类号 H01L21/302
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