发明名称 Conductive carbon nanotube tip, probe of scanning probe microscope comprising the same and manufacturing method of the conductive carbon nanotube tip
摘要 A conductive carbon nanotube tip and a manufacturing method thereof are provided. The conductive carbon nanotube tip includes a carbon nanotube tip substantially vertically placed on a substrate, and a ruthenium coating layer covering a surface of the carbon nanotube tip and extending to at least a part of the substrate. The manufacturing method includes substantially vertically placing a carbon nanotube tip on a substrate, and forming a ruthenium coating layer on the carbon nanotube tip and at least a part of the substrate.
申请公布号 KR101159074(B1) 申请公布日期 2012.06.25
申请号 KR20060004170 申请日期 2006.01.14
申请人 发明人
分类号 G01Q70/12;B82B1/00;C01B31/02;G01Q60/38;G01Q60/40;G01Q60/46;G01Q60/48;G01Q70/00 主分类号 G01Q70/12
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