发明名称 |
Conductive carbon nanotube tip, probe of scanning probe microscope comprising the same and manufacturing method of the conductive carbon nanotube tip |
摘要 |
A conductive carbon nanotube tip and a manufacturing method thereof are provided. The conductive carbon nanotube tip includes a carbon nanotube tip substantially vertically placed on a substrate, and a ruthenium coating layer covering a surface of the carbon nanotube tip and extending to at least a part of the substrate. The manufacturing method includes substantially vertically placing a carbon nanotube tip on a substrate, and forming a ruthenium coating layer on the carbon nanotube tip and at least a part of the substrate. |
申请公布号 |
KR101159074(B1) |
申请公布日期 |
2012.06.25 |
申请号 |
KR20060004170 |
申请日期 |
2006.01.14 |
申请人 |
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发明人 |
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分类号 |
G01Q70/12;B82B1/00;C01B31/02;G01Q60/38;G01Q60/40;G01Q60/46;G01Q60/48;G01Q70/00 |
主分类号 |
G01Q70/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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