发明名称 SAMPLE ANALYZING CHIP AND MEASUREMENT SYSTEM USING SAME
摘要 Temperature of a sensor chip itself rises with the supply of power owing to temperature dependence of the sensor chip as its basic characteristics. When a chemiluminescence reagent is added at the point of time at which the temperature rise reaches a steady state and a sensor chip photodiode dark current becomes constant, a drastic shift occurs in the sensor chip temperature. Remarkable dispersion occurs at this time in the sensor chip photodiode dark current Variance (unstability) of the sensor chip photodiode dark current can be decreased by reducing the temperature fluctuation of the sensor chip to minimum by using an exothermal effect of a thermal diffusion medium.
申请公布号 US2012156766(A1) 申请公布日期 2012.06.21
申请号 US201013379696 申请日期 2010.06.15
申请人 SHIRATORI AKIKO;YAZAWA YOSHIAKI;FUJITA TAKESHI;HARADA KUNIO;UCHIDA KENKO 发明人 SHIRATORI AKIKO;YAZAWA YOSHIAKI;FUJITA TAKESHI;HARADA KUNIO;UCHIDA KENKO
分类号 C12M1/40;G01N21/76 主分类号 C12M1/40
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