| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a mount capable of retaining a sample carrier in stable and stress-free electron microscope inspection. <P>SOLUTION: A mount includes a substrate having an opening penetrating through a central area, a supporting surface of a sample carrier at least partially extending around the opening, and a retaining device for retaining the sample carrier by frictional engagement on the supporting surface provided on the substrate. The retaining device includes at least two mutually independent clip members for retaining the sample carrier by frictional engagement. The clip members extend toward a direction of the opening from the substrate, and the clip members can retain the sample carriers on the supporting surface in an end area of the sample carrier in the electron microscope inspection away from each other. Also, a device for locating the mount, to which the sample carrier in the electron microscope inspection is mounted, and a method for using the locating device are provided. <P>COPYRIGHT: (C)2012,JPO&INPIT |
