发明名称 Double-Sided Semiconductor Device and Method of Forming Top-Side and Bottom-Side Interconnect Structures
摘要 A semiconductor device is made by forming a first active device on a first side of a semiconductor wafer. A first insulating layer is formed over the first side of the wafer. A first conductive layer is formed over the first insulating layer. A first interconnect structure is formed over the first insulating layer and first conductive layer. A temporary carrier is mounted to the first interconnect structure. A second active device is formed on a second side of the semiconductor wafer. A second insulating layer is formed over the second side of the wafer. A second conductive layer is formed over the second insulating layer. A second interconnect structure is formed over the second insulating layer and second conductive layer. The temporary carrier is removed, leaving a double-sided semiconductor device. The double-sided semiconductor device is enclosed in a package with the first and second interconnect structures electrically connected.
申请公布号 US2012153452(A1) 申请公布日期 2012.06.21
申请号 US201213408715 申请日期 2012.02.29
申请人 KIM OHHAN;PARK JOUNGUN;KIM SUNMI;STATS CHIPPAC, LTD. 发明人 KIM OHHAN;PARK JOUNGUN;KIM SUNMI
分类号 H01L23/538 主分类号 H01L23/538
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