发明名称 COMPOUND SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a compound semiconductor device in which an electron traveling layer and an electron supply layer of good crystallinity can be obtained while minimizing warpage, or the like, due to the difference of thermal expansion coefficient of a material, and to provide a method of manufacturing the same. <P>SOLUTION: A substrate 1, an electron traveling layer 3 formed on the substrate 1, an electron supply layer 4 formed above the electron traveling layer 3, and a buffer layer 2 formed between the substrate 1 and the electron traveling layer 3 and containing Al<SB POS="POST">x</SB>Ga<SB POS="POST">1-x</SB>N(0&le;x&le;1) are provided. The value of x represents a plurality of maximums and a plurality of minimums in the thickness direction of the buffer layer 2, and variation of the value of x is 0.5 or less in any region where the thickness in the buffer layer 2 is 1 nm. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012119586(A) 申请公布日期 2012.06.21
申请号 JP20100269714 申请日期 2010.12.02
申请人 FUJITSU LTD 发明人 SHIMIZU SANAE;IMANISHI KENJI;YAMADA ATSUSHI;MIYAJIMA TOYOO
分类号 H01L21/338;H01L29/778;H01L29/812;H02M7/12 主分类号 H01L21/338
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