| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a quantum yield measuring apparatus capable of accurately and efficiently measuring a quantum yield of a sample. <P>SOLUTION: A quantum yield measuring apparatus 1A comprises: a dark box 5 in which a sample storage part 3 of a sample cell 2 is internally placed; a light generation part 6 for generating excitation light L1; a light detection part 9 for detecting light L2 to be measured; an integrating sphere 14 disposed inside the dark box 5; and a movement mechanism 30 for moving the integrating sphere 14 inside the dark box 5. The light generation part 6 includes a light emission part 7 connected to the dark box 5, and the light detection part 9 includes a light incident part 11 connected to the dark box 5. The integrating sphere 14 includes a light incident opening 15 for making the excitation light L1 incident and a light emission opening 16 for emitting the light L2 to be measured. The movement mechanism 30 moves the sample storage part 3, the light emission part 7, and the light incident part 11 so as to obtain respective states of a first state in which the sample storage part 3 is located inside the integrating sphere 14 and a second state in which the sample storage part 3 is located outside the integrating sphere 14. <P>COPYRIGHT: (C)2012,JPO&INPIT |
