| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an analysis support device which supports analysis of a specimen by a surface plasmon resonance fluorescence analyzer by detecting a metal film inappropriate to the analysis of the specimen, so as to maintain analysis accuracy of the specimen, and to provide the surface plasmon resonance fluorescence analyzer having the analysis support device. <P>SOLUTION: An analysis support device 40 and a surface plasmon resonance fluorescence analyzer 10 having the analysis support device 40 of the present invention comprise: a defective area detection part 41 for detecting a defective area where a defect is generated in a metal film 55; and a determination part 42 which, when a value for the defective area is under a predetermined threshold value, determines that the metal film 55 is appropriate to analysis of a specimen and outputs the determination result to the outside, and when the value for the defective area is equal to or above the predetermined threshold value, determines that the metal film 55 is inappropriate to the analysis of the specimen and outputs the determination result to the outside. <P>COPYRIGHT: (C)2012,JPO&INPIT |
