METHOD AND DEVICE FOR OPTICAL EXAMINATION IN REFLECTION GEOMETRY

摘要

The invention relates to a method for locating at least one optical marker in a scattering medium, wherein the medium is energized a number of times by sweeping an energization beam over the surface of said scattering medium according to a periodic pattern. Each position of the energization beam enables the emission of a corresponding signal, said signal comprising one or more components of interest arising from one or more markers, as well as a parasitic component arising from a portion of the medium not comprising the markers. Each optical signal is filtered by removing at least the signal from the area occupied by the energization beam on the surface of said scattering medium. Then, each signal acquired (X) using the radiation sensor (8).