Device for Measuring Deformation of a Structure and a Method for Measuring Deformation of a Structure Using the Same

摘要

The present invention relates to a device for measuring a deformation ratio of a structure and a method of measuring a deformation ratio of a structure using the same. More specifically, the device for measuring a deformation ratio of a structure according to the present invention comprises a photonic crystal layer containing nanoparticles aligned at a certain interval. According to the present invention, when various industrial structures are deformed by a working load, and the like, presence of deformation and the correct deformation ratio in the structures may be simply and easily measured by measuring the change of structural color or magnetic flux in the corresponding part, and this measurement of deformation may also prevent accidents due to excessive deformation in structures.