| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a quantum yield measuring apparatus capable of accurately and efficiently measuring a quantum yield of a sample. <P>SOLUTION: A quantum yield measuring apparatus 1 comprises: a dark box 5 in which a sample storage part 3 of a sample cell 2 is internally placed; a light generation part 6 for generating excitation light L1; a light detection part 9 for detecting light L2 to be measured; an integrating sphere 14 disposed inside the dark box 5; and a movement mechanism 30 for moving the integrating sphere 14 inside the dark box 5. The light generation part 6 includes a light emission part 7 connected to the dark box 5, and the light detection part 9 includes a light incident part 11 connected to the dark box 5. The integrating sphere 14 includes a light incident opening 15 for making the excitation light L1 incident and a light emission opening 16 for emitting the light L2 to be measured. The movement mechanism 30 moves the integrating sphere 14 so as to obtain respective states of a first state in which the sample storage part 3 is located inside the integrating sphere 14 and a second state in which the sample storage part 3 is located outside the integrating sphere 14. <P>COPYRIGHT: (C)2012,JPO&INPIT |
