发明名称 METHOD FOR MEASURING RETARDATION OF OPTICALLY ANISOTROPIC FILM
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for measuring retardation of each layer of an optically anisotropic film comprising two types of layers without separating the respective layers. <P>SOLUTION: The retardation of the optically anisotropic film is measured by: a step for applying light in a substantially perpendicular direction to the optically anisotropic film and measuring a change (1) in its transmission and polarization state; a step for applying light to a direction of an azimuth angle of -5&deg; to +5&deg; and a polar angle of &theta;<SB POS="POST">1</SB>(where, 30&deg;&le;&theta;<SB POS="POST">1</SB>&le;70&deg;) with respect to an in-plane slow-axis direction of the optically anisotropic film and measuring a change (2) in the transmission and polarization state; a step for applying light to a direction of azimuth angle of &theta;<SB POS="POST">2</SB>(where, 30&deg;&le;&theta;<SB POS="POST">2</SB>&le;60&deg;) and a polar angle of &theta;<SB POS="POST">3</SB>(where, 30&deg;&le;&theta;<SB POS="POST">3</SB>&le;70&deg;) with respect to the in-plane slow-axis direction of the optically anisotropic film and measuring a change (3) in the transmission and polarization state; and a step for calculating an in-plane retardation Re and a thickness-direction retardation Rth of each layer using the changes (1)-(3) in the transmission and polarization state. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012117828(A) 申请公布日期 2012.06.21
申请号 JP20100265105 申请日期 2010.11.29
申请人 NIPPON ZEON CO LTD 发明人 RA HUNGU CHIONGU;SATO TAKASHI
分类号 G01N21/23;G02B5/30 主分类号 G01N21/23
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