发明名称 Solder material test apparatus, and method of controlling the same
摘要 <p>A solder material test apparatus includes a control unit and a storage unit which stores master data in advance in which a printing process time when a printing process is performed by using a test-sample solder material is associated with deterioration degree data of the test-sample solder material at the printing process time. The control unit includes a deterioration degree data acquiring unit which acquires deterioration degree data for indicating a deterioration degree of a test-sample solder material, a reading unit which reads a printing process time associated with deterioration degree data set as a limit value with reference to master data and reads a printing process time associated with the deterioration degree data acquired by the deterioration degree data acquiring unit, an operating unit which operates an available remaining time that indicates difference between the printing process times, and a display control unit which informs the available remaining time to a user.</p>
申请公布号 EP1801565(B1) 申请公布日期 2012.06.20
申请号 EP20060017141 申请日期 2006.08.17
申请人 OMRON CORPORATION 发明人 ONISHI, YASUHIRO;HORINO, MASANOBU;OHASHI, KATSUMI
分类号 G01N21/27;B23K1/00;B23K3/06;B23K101/42;G01N21/35;G01N21/3563;H05K3/12;H05K3/34 主分类号 G01N21/27
代理机构 代理人
主权项
地址