发明名称 METHOD OF FABRICATING LOW TEMPERATURE SOLUTION-PROCESSED OXIDE THIN FILM AND TRANSISTORS COMPRISING THE SAME
摘要 <p>PURPOSE: A method for manufacturing a low temperature solution based oxide semiconductor thin film and a thin film transistor including the same are provided to reduce costs due to a high temperature process by forming an oxide semiconductor thin film at the lower temperature than 350 degrees centigrade. CONSTITUTION: A gate electrode is formed on a substrate. A gate insulation layer is formed on the substrate including the gate electrode. An oxide semiconductor layer is formed on the gate insulation layer. An oxide semiconductor thin film is formed on the substrate by thermally processing oxide semiconductor solutions sprayed on the substrate below 350 degrees centigrade.</p>
申请公布号 KR20120064970(A) 申请公布日期 2012.06.20
申请号 KR20100126251 申请日期 2010.12.10
申请人 INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY 发明人 KIM, HYUN JAE;KIM, KYUNG MIN;BAE, JUNG HYEON;JEONG, WOONG HEE
分类号 H01L29/786;G02F1/136 主分类号 H01L29/786
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