| 摘要 |
PROBLEM TO BE SOLVED: To shorten the total time required for a burn-in test. SOLUTION: A programmable logic device 150 is formed on a burn-in board BIB, and when performing a burn-in test, a test pattern signal and a logical value are supplied to the programmable logic device 150. The test pattern signal is further supplied from the programmable logic device 150 to a plurality of devices DUT to be tested, and output signals from the devices DUT to be tested are compared with the logical value in the programmable logic device 150, and the compared results are stored in the programmable logic device 150 as test results. Thereby, the test pattern signal can be supplied at a high frequency from a test control device 100, and it is unnecessary for the test control device 100 to directly read out output signals from the test devices DUT to be tested. COPYRIGHT: (C)2012,JPO&INPIT |
