发明名称 Method for fabricating light emitting semiconductor device for reducing defects of dislocation in the device
摘要 A semiconductor device fabrication method is disclosed. A buffer layer is provided and a first semiconductor layer is formed on the buffer layer. Next, a first intermediate layer is formed on the first semiconductor layer by dopant with high concentration during an epitaxial process. A second semiconductor layer is overlaid on the first intermediate layer. A semiconductor light emitting device is grown on the second semiconductor layer. The formation of the intermediate layer and the second semiconductor layer is a set of steps.
申请公布号 US8202752(B2) 申请公布日期 2012.06.19
申请号 US20090488875 申请日期 2009.06.22
申请人 HUANG SHIH CHENG;TU PO MIN;YEH YING CHAO;LIN WEN YU;WU PENG YI;CHAN SHIH HSIUNG;ADVANCED OPTOELECTRONIC TECHNOLOGY, INC. 发明人 HUANG SHIH CHENG;TU PO MIN;YEH YING CHAO;LIN WEN YU;WU PENG YI;CHAN SHIH HSIUNG
分类号 H01L21/00;H01L21/205;H01L21/338;H01L33/12;H01L33/32;H01S5/323 主分类号 H01L21/00
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