发明名称 |
NITRIDE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THEREOF |
摘要 |
PURPOSE: A nitride type semiconductor device and a manufacturing method thereof are provided to maintain distance between a source electrode and a drain electrode by forming an ohmic junction by using second ohmic metal of an aluminum group and improving surface roughness of the ohmic junction. CONSTITUTION: Nitride system epi layers(20-40) are formed on a base substrate(10). A source electrode(61) is formed on the nitride system epi layers. A drain electrode(63) separated from the source electrode is formed on the nitride system epi layers. The source electrode and the drain electrode comprise a first ohmic junction(55) and a second ohmic junction(59). The second ohmic junction covers a part of the first ohmic junction. A gate electrode is formed between the source electrode and the drain electrode. |
申请公布号 |
KR101154870(B1) |
申请公布日期 |
2012.06.18 |
申请号 |
KR20100135766 |
申请日期 |
2010.12.27 |
申请人 |
KOREA ELECTRONICS TECHNOLOGY INSTITUTE |
发明人 |
CHOI, HONG GOO;HAHN, CHEOL KOO |
分类号 |
H01L29/778 |
主分类号 |
H01L29/778 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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