| 摘要 |
<p>The testing of voltage protection devices, in particular during the in-service life of a product is disclosed. A method of testing a protection device in a circuit arranged to be provided with a source and a load is disclosed, comprising providing a detector in parallel with the protection device; opening a switching device provided in the circuit and detecting a property of the voltage spike caused by the rate of change of current in the circuit inductance produced by the opening of the switching device to determine the condition of the protection device. If the detected property of the voltage spike, such as its peak voltage, is not an expected predetermined value or within an expected predetermined range it may be assumed that there is a fault in the protection device. Thus the protection device may be reliably tested during its in-service life.</p> |
