发明名称 |
APPAREIL DE MESURE DE LA RESISTANCE ELECTRIQUE LOCALE D'UNE SURFACE. |
摘要 |
Apparatus for measuring the local electrical resistance of a surface, the apparatus comprising: a DC voltage source for applying a bias voltage (Vpol) to the sample (E) for characterizing; a measurement circuit (CM) capable of being connected to a conductive probe suitable for coming into contact with a surface (SE) of said sample in order to generate a signal (S) representative of a contact resistance between said conductive probe and said surface of the sample; and a control device (CMD) for controlling said measurement circuit; the apparatus being characterized in that said measurement circuit comprises: a measurement resistive two-terminal network (DM) presenting variable resistance and connected between said conductive probe and a ground of the circuit; and a calculation unit (UC) for generating said signal representative of a contact resistance between said conductive probe and said surface of the sample as a function of a voltage (Vs) across the terminals of said measurement resistive two-terminal network. |
申请公布号 |
FR2959824(B1) |
申请公布日期 |
2012.06.15 |
申请号 |
FR20100001940 |
申请日期 |
2010.05.05 |
申请人 |
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE;UNIVERSITE PIERRE ET MARIE CURIE (PARIS 6);ECOLE SUPERIEURE D'ELECTRICITE |
发明人 |
SCHNEEGANS OLIVIER;CHRETIEN PASCAL;HOUZE FREDERIC |
分类号 |
G01R27/02 |
主分类号 |
G01R27/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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