发明名称 APPAREIL DE MESURE DE LA RESISTANCE ELECTRIQUE LOCALE D'UNE SURFACE.
摘要 Apparatus for measuring the local electrical resistance of a surface, the apparatus comprising: a DC voltage source for applying a bias voltage (Vpol) to the sample (E) for characterizing; a measurement circuit (CM) capable of being connected to a conductive probe suitable for coming into contact with a surface (SE) of said sample in order to generate a signal (S) representative of a contact resistance between said conductive probe and said surface of the sample; and a control device (CMD) for controlling said measurement circuit; the apparatus being characterized in that said measurement circuit comprises: a measurement resistive two-terminal network (DM) presenting variable resistance and connected between said conductive probe and a ground of the circuit; and a calculation unit (UC) for generating said signal representative of a contact resistance between said conductive probe and said surface of the sample as a function of a voltage (Vs) across the terminals of said measurement resistive two-terminal network.
申请公布号 FR2959824(B1) 申请公布日期 2012.06.15
申请号 FR20100001940 申请日期 2010.05.05
申请人 CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE;UNIVERSITE PIERRE ET MARIE CURIE (PARIS 6);ECOLE SUPERIEURE D'ELECTRICITE 发明人 SCHNEEGANS OLIVIER;CHRETIEN PASCAL;HOUZE FREDERIC
分类号 G01R27/02 主分类号 G01R27/02
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