发明名称 A METHOD TO CONDUCT AN ELECTROMIGRATION TEST FOR HIGH CAPACITY AND HIGH CURRENT AND A CIRCUIT THEREOF
摘要 An electronic device under test (DUT) may be incorporated into a circuit having a voltage limiter connected in parallel with the DUT. The circuit includes a controlled current source having an output current connected in series with the DUT. The voltage limiter is characterized in that, when the output current is such that the voltage across the DUT (Vdut) would exceed a particular maximum voltage Vmax, without the voltage limiter in place, at least a portion of the output current flows through the voltage limiter, so as to limit Vdut to be less than or equal to Vmax. When the output current is such that Vdut would be less than or equal to Vmax, current does not flow through the voltage limiter. The circuit may include a plurality of DUTs, each DUT connected in series with the output current of a controlled current source, with a voltage limiter connected in parallel with each DUT.
申请公布号 KR101157354(B1) 申请公布日期 2012.06.15
申请号 KR20107016761 申请日期 2008.12.16
申请人 发明人
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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