| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a Kelvin contact probe capable of responding to a narrow pitch of electrodes, irrespective of the shape of the electrodes of an inspection object and avoiding a manufacture cost increase of a circuit board; and to provide a Kelvin inspection jig having the same. <P>SOLUTION: A Kelvin inspection jig 100 includes contact probes 10 and 20. The contact probe 10 includes an electrode-side contact terminal 11 coming into contact with a solder ball 61, and a land-side contact terminal 12 coming into contact with a land 71. The contact probe 20 includes an electrode-side contact terminal 21 coming into contact with the solder ball 61, and a land-side contact terminal 22 coming into contact with a land 72. The contact probes 10 and 20 are disposed such that an electrode-side inclined surface 11a and an electrode-side inclined surface 21a face opposite sides, and that a land-side inclined surface 12a and a land-side inclined surface 22a face each other. <P>COPYRIGHT: (C)2012,JPO&INPIT |
