发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 A first resist pattern is formed by exposure using a first multi-tone photomask, and a first conductive layer, a first insulating layer, a first semiconductor layer, and a second semiconductor layer are etched, so that an island-shaped single layer and an island-shaped stack are formed. Here, sidewalls are formed on side surfaces of the island-shaped single layer and the island-shaped stack. Further, a second resist pattern is formed by exposure using a second multi-tone photomask, and a second conductive layer and the second semiconductor layer are etched, so that a thin film transistor, a pixel electrode, and a connection terminal are formed. After that, a third resist pattern is formed by exposure from a rear side using metal layers of the first conductive layer and the second conductive layer as masks, and the third insulating layer are etched, so that a protective insulating layer is formed.
申请公布号 US2012149157(A1) 申请公布日期 2012.06.14
申请号 US201213398883 申请日期 2012.02.17
申请人 HOSOYA KUNIO;FUJIKAWA SAISHI;SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 HOSOYA KUNIO;FUJIKAWA SAISHI
分类号 H01L21/336;G02F1/1368;H01L29/786 主分类号 H01L21/336
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