| 摘要 |
A debug port configured to generate and provide a return clock is disclosed. In one embodiment, an integrated circuit (IC) includes one or more functional units and a debug port (DP). The DP is configured to enable access by an external debugger to the functional unit(s) of the IC for debugging purposes. The DP includes circuitry that may generate a first clock signal that is provided to the functional unit(s) during debug operations. Receiving test result data at the DP may require a return clock signal that is not provided by the functional unit(s). Accordingly, the IC may include a clock modifier coupled to receive the first clock signal. The clock modifier may generate a second clock signal based on the first, the second clock signal being provided to the DP as a return clock signal. |
