| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a component mounter and a method for recognizing a substrate mark in the component mounter which can easily perform an image recognition of the substrate mark even when size of the substrate mark changes with time. <P>SOLUTION: In a method for recognizing a substrate mark in a component mounter, after extracting a region corresponding to the substrate mark M from a captured image SC as a mark region Rg, a template Tp is compared with the extracted mark region Rg. When the template Tp and the mark region Rg do not match each other, size of the template Tp is changed to be compared with the mark region Rg again. When the template Tp and the mark region Rg matches each other, the mark region Rg matched with the template Tp is selected as an image recognition object and an image recognition is performed. And the template Tp matched with the mark region Rg is registered as the template Tp that is used first when performing a comparison with the next mark region Rg to be extracted. <P>COPYRIGHT: (C)2012,JPO&INPIT |
