发明名称 |
SYSTEM OF MEASURING A RESISTANCE OF A RESISTIVE MEMORY DEVICE |
摘要 |
A system for measuring a resistance of a memory cell in a resistive memory device can include a pulse generator configured to apply a data write pulse and a resistance read pulse to the resistive memory device with a delay time. A connecting member can be connected between the pulse generator and the resistive memory device. A test measurement device can be connected to the resistive memory device outputting a pulse waveform and a data-processing member can be configured to determine the resistance of the resistive memory device using the pulse waveform and an internal resistance of the test measurement device. |
申请公布号 |
US2012147658(A1) |
申请公布日期 |
2012.06.14 |
申请号 |
US201213399469 |
申请日期 |
2012.02.17 |
申请人 |
KIM YOUNG-KUK;PARK MI-LIM;IHIDEKI HORI;SUH DONG-SEOK;SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM YOUNG-KUK;PARK MI-LIM;IHIDEKI HORI;SUH DONG-SEOK |
分类号 |
G11C11/00 |
主分类号 |
G11C11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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