发明名称 PATTERN MATCHING METHOD, PATTERN MATCHING PROGRAM, ELECTRONIC COMPUTER, AND ELECTRONIC DEVICE TESTING APPARATUS
摘要 Disclosed is a pattern matching method whereby a testing point can be searched accurately while simplifying the work of presetting. An image region of a part of a captured image is extracted, and a divided image of the image region is set as a template image. A pattern matching is performed by rotating the template image. Moreover, the pattern matching determines whether a point-symmetric pattern exists inside the image region.
申请公布号 KR20120062873(A) 申请公布日期 2012.06.14
申请号 KR20127008724 申请日期 2010.10.04
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 TOYODA YASUTAKA;IKEDA MITSUJI;ABE YUICHI
分类号 G06T7/00;G01N21/956 主分类号 G06T7/00
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