发明名称 |
PATTERN MATCHING METHOD, PATTERN MATCHING PROGRAM, ELECTRONIC COMPUTER, AND ELECTRONIC DEVICE TESTING APPARATUS |
摘要 |
Disclosed is a pattern matching method whereby a testing point can be searched accurately while simplifying the work of presetting. An image region of a part of a captured image is extracted, and a divided image of the image region is set as a template image. A pattern matching is performed by rotating the template image. Moreover, the pattern matching determines whether a point-symmetric pattern exists inside the image region. |
申请公布号 |
KR20120062873(A) |
申请公布日期 |
2012.06.14 |
申请号 |
KR20127008724 |
申请日期 |
2010.10.04 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORPORATION |
发明人 |
TOYODA YASUTAKA;IKEDA MITSUJI;ABE YUICHI |
分类号 |
G06T7/00;G01N21/956 |
主分类号 |
G06T7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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