| 摘要 |
PURPOSE: A burn-in tester is provided to create a strobe signal for accurately sampling a feedback result signal from a semiconductor device, thereby accurately sampling data in a high speed operation. CONSTITUTION: A burn-in tester(200) comprises nine test boards(210), a board receiving chamber(220), nine tester substrates(230), and a substrate receiving chamber(240). The test board includes an array of sockets for loading a semiconductor device. An electric circuit includes transmission line groups. The transmission line groups provide a test signal to the sockets. The board receiving chamber receives one or more test boards. The tester substrate is electrically connected to the test board stored in the board receiving chamber. The tester substrate creates a test signal for testing the semiconductor devices loaded on the test board. The substrate receiving chamber receives the tester substrate. |
