| 摘要 |
PURPOSE: A device and a method for inspecting a shape are provided to efficiently eliminate faults of a printed circuit board and to enhance the accuracy of an inspection by using brightness of a two-dimensional shape. CONSTITUTION: A method for inspecting a shape is as follows. Lattice images reflected from the measurement object containing a pad unit(121) for an electrical connection with external devices are obtained while moving a lattice as predetermined times. A confidence index with respect to the lattice images is obtained by using the lattice images. The obtained confidence index is used for inspecting scratches on a surface of the pad unit. If a range of the obtained confidence index is within a set range, the measurement object is fine. If the range of the obtained confidence index is out of the set range, the measurement object is faulty.
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