| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a power supply control system which is capable of individually controlling power supply voltages supplied to a plurality of functional circuit blocks while suppressing circuit scale of a semiconductor device including the plurality of functional circuit blocks. <P>SOLUTION: A test control section 103 detects a functional circuit block D109 in an idle state and thereafter outputs a voltage drop instruction through an address/data bus 101 to a power supply control section 104. After power supply voltage drop completion in a power supply domain D113, the test control section 103 transmits a test pattern through the address/data bus 101 to the functional circuit block D109 and compares a result with an expected value. In the case where it is discriminated that, on the basis of a comparison result, any abnormality such as a delay error caused by a voltage difference occurs, in order to recover the functional circuit block D109 into a normal state, the test control section 103 outputs a voltage boost instruction for the power supply domain D113 to the power supply control section 104. <P>COPYRIGHT: (C)2012,JPO&INPIT |
