| 摘要 |
<p>The present invention relates to a method and device for determining at least a first parameter of a track: the method comprises providing first track geometry quality data (110, 120) associated to at least one point along a rail at a first temperature, providing second track geometry quality data (130, 140) associated to said at least one point at a second temperature, describing (160) a difference between the first and second track geometry quality data by means of a model relating the first and second track geometry quality data with associated temperatures to stress free temperature and/or track resistance, and estimating (170) the stress free temperature and/or track resistance in said at least one point based on the model.</p> |
