发明名称 |
METHOD OF MANUFACTURING HIGH FREQUENCY DEVICE STRUCTURES |
摘要 |
PURPOSE: A manufacturing method of a high frequency device structure is provided to reduce initial reaction energy with a substrate material while diffusing Pt/Pd in a thermal process, thereby stably manufacturing a normally-off type high frequency device. CONSTITUTION: A Schottky barrier layer, an etch-stop layer(106), an ohmic layer(107), and an ohmic electrode are formed on a substrate. A first recess is formed in order to expose a part of the etch-stop layer. A second recess is formed in order to expose a part of the Schottky barrier slayer after forming a gate pattern on the first recess. A gate electrode(115) is formed by depositing a heat resistant metal film after forming a super lattice film by alternately depositing Pt and Pd on the second recess and the gate pattern. |
申请公布号 |
KR20120062346(A) |
申请公布日期 |
2012.06.14 |
申请号 |
KR20100123566 |
申请日期 |
2010.12.06 |
申请人 |
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE |
发明人 |
YOON, HYUNG SUP;MIN, BYOUNG GUE;AHN, HO KYUN;LEE, SANG HEUNG;KIM, HAE CHEON |
分类号 |
H01L21/338;H01L29/812 |
主分类号 |
H01L21/338 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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