发明名称 METHOD OF MANUFACTURING HIGH FREQUENCY DEVICE STRUCTURES
摘要 PURPOSE: A manufacturing method of a high frequency device structure is provided to reduce initial reaction energy with a substrate material while diffusing Pt/Pd in a thermal process, thereby stably manufacturing a normally-off type high frequency device. CONSTITUTION: A Schottky barrier layer, an etch-stop layer(106), an ohmic layer(107), and an ohmic electrode are formed on a substrate. A first recess is formed in order to expose a part of the etch-stop layer. A second recess is formed in order to expose a part of the Schottky barrier slayer after forming a gate pattern on the first recess. A gate electrode(115) is formed by depositing a heat resistant metal film after forming a super lattice film by alternately depositing Pt and Pd on the second recess and the gate pattern.
申请公布号 KR20120062346(A) 申请公布日期 2012.06.14
申请号 KR20100123566 申请日期 2010.12.06
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 YOON, HYUNG SUP;MIN, BYOUNG GUE;AHN, HO KYUN;LEE, SANG HEUNG;KIM, HAE CHEON
分类号 H01L21/338;H01L29/812 主分类号 H01L21/338
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